SMTA International 2026: Full Schedule

8:30am CDT

INS1: AI Infiltrates Inspection: Latest from the Coalface

Tuesday October 27, 2026 8:30am - 10:00am CDT

Session Chair:
Session Co-Chair:

8:30am-9:00am
Counterfeit Detection as an AI-Based AOI Software Add-On
Presenter: Eyal Weiss, Ph.D., Cybord

9:00am-9:30am
AI-Native Automated Optical Inspection: Sub-10-Minute Programming for New Boards with Low False-Call Rates
Presenter: Collin Stoner, Selene Photonics

9:30am-10:00am AI Applications in Inspection: Enhancing SMT Manufacturing Inspection
Presenter: David Chiu, Test Research Inc.
Co-Author: Roberto Yebra, Test Research, Inc.

Speakers

Eyal Weiss

Founder & CTO, Cybord

Dr. Eyal Weiss is the Founder and Chief Technology Officer (CTO) of Cybord, a company specializing in AI-driven solutions for electronic manufacturing that protect against counterfeit and tampered components, providing full transparency and resilience across the supply chain. With... Read More →

Collin Stoner

Consulting Engineer, Selene Photonics Inc.

Collin Stoner is an electronics and product design consultant and the Owner and Principal Consulting Engineer of Selene Photonics Inc. (DBA NVZN Labs), where he leads a team that designs custom electronics and manufactures PCBAs for clients across aerospace, defense, and emerging-technology... Read More →

David Chiu

Sales Manager, Test Research, Inc (TRI)

David Chiu, Sales Manager, Test Research, Inc. (TRI) David Chiu is a seasoned professional in the electronics manufacturing and test industry, currently serving as a Sales Manager at Test Research, Inc. (TRI). With over 15 years of dedicated service at TRI, David has built a comprehensive... Read More →

Tuesday October 27, 2026 8:30am - 10:00am CDT
INS

Conference Session, INS Track

10:30am CDT

INS2: Cautionary Tales from Imaging Analysis

Tuesday October 27, 2026 10:30am - 12:00pm CDT

INS

Session Chair:
Session Co-Chair:

10:30am-11:00am
AOI Should Not Be Used as a Pass/Fail Gate: Applying SPC Principles to Inspection Data for Earlier Root Cause Identification in SMT
Presenter: Jeremy Orbach, Omron Automation USA

11:00am-11:30am
Computed Tomography (CT) vs. Computed Laminography CL for Non-Destructive Inspection of Printed Circuit Boards and Electronic Packages
Presenter: Vineeth Bastin, Comet Technologies USA Inc.
Co-Author: David Kruidhof, Comet Technologies USA Inc

11:30am-12:00pm
Failure Mechanism Investigation of NVMe Link Degradation from PCIe Gen4 to Gen3 Due to PCB Dielectric Collapse
Presenter: Zhipeng Wang, IBM Corporation

Speakers

Jeremy Orbach

Application Engineer II, Omron Automation Americas

Jeremy Orbach is an Applications Engineer and technical leader in electronics manufacturing focused on AOI, SPI, AXI, machine vision, and data-driven process improvement. At Omron Automation Americas, he supports customers in applying inspection systems not only to detect defects... Read More →

Vineeth Bastin

Senior Applications Engineer, Comet Technologies USA inc

Vineeth Bastin is a Senior Applications Engineer at Comet Yxlon, with over 15 years of experience in advanced electronics inspection systems. He has a strong track record in driving the adoption of X-ray, CT, and bond testing technologies, enhancing customer training programs, and... Read More →

Zhipeng Wang

Project Manager, IBM Corporation

Zhipeng (Grady) WangTitle:Project Manager, Global Supplier Test EngineeringOrganization:System Supply Chain, IBM CorporationBio:Grady is currently a Supply Chain Engineering Professional at IBM, where he specializes in test solution delivery for medium- to high-complexity server applications... Read More →

Tuesday October 27, 2026 10:30am - 12:00pm CDT
INS

Conference Session, INS Track

1:30pm CDT

INS3: Eat Your Vegetables, Part I: Test Methods You Need to Know

Tuesday October 27, 2026 1:30pm - 3:00pm CDT

INS

Session Chair:
Session Co-Chair:

1:30pm-2:00pm
Process Qualification to J-STD-001 Section 8 Cleanliness
Presenter: Mike Bixenman, Ph.D., Magnalytix, LLC
Co-Author: Zach Papiez, Magnalytix, LLC

2:30pm-3:00pm
Mitigation Strategies for Failures Resulting from Ionizing Radiation
Presenter: David Kruidhof, Comet Technologies USA, Inc.
Co-Author: Vineeth Bastin, Comet Technologies USA, Inc.

3:00pm-3:30pm
Mitigation Strategies for Failures Resulting from Ionizing Radiation
Presenter: Matt Turpin, Datest Corporation

Speakers

Mike Bixenman

SME Cleaning and Reliability, Magnalytix, LLC

Dr. Mike Bixenman is a Subject Matter Expert in Cleaning and Reliability. He has over 35 years of experience in designing electronic assembly cleaning materials and integrating processes. Sharing his research, knowledge, and expertise is Mike’s passion. He believes in the power... Read More →

David Kruidhof

Technical Sales Manager, Comet Technologies USA, Inc.

David Kruidhof is the Technical Sales Manager for Comet Yxlon, who provide X-ray, laminography, and CT inspection systems for R&D labs and production environments, especially for semiconductor manufacturers and PCB assemblers. In his role at Comet Yxlon, David is responsible for technical... Read More →

Matt Turpin

Sr. Test Engineer, Datest Corporation

Matt Turpin is Sr. Test Engineer at Datest, responsible for ICT program and fixture development, and pre-development mechanical and electrical DFT analysis. Matt has over 45 years’ experience in testing and test engineering, primarily with Zehntel, Teradyne, and HP/Agilent/Keysight... Read More →

Tuesday October 27, 2026 1:30pm - 3:00pm CDT
INS

Conference Session, INS Track

3:30pm CDT

INS4: Eat Your Vegetables, Part II: Test Methods You Need to Know

Tuesday October 27, 2026 3:30pm - 5:00pm CDT

INS

Session Chair:
Session Co-Chair:

3:30pm-4:00pm
FCT for RF/High Speed Applications with Test Probes. Strategies, Pitfalls and How to Avoid Those
Presenter: Matthias Zapatka, Ingun USA

4:00pm-4:30pm
A Three-Camera based Digital Image Correlation System for Warpage Measurement and CTE Distribution Analysis
Presenters: Liam Crosbie, Dantec Dynamics
Co-Author: LiKang Luan, Dantec Dynamics

4:30pm-5:00pm
Need for speed: Boosting X-Ray Inspection Speed in Advanced Electronics
Presenter: Chris Nicholson, Ph.D., Comet X-Ray
Co-Author: Anthony Williams, Comet X-Ray

Speakers

Matthias Zapatka

Senior FAE, INGUN USA, Inc.

Matthias is the co-founder and Sr. FAE at INGUN USA, Inc. the North American subsidiary of the INGUN group. He has been in the PCBA test industry for over 18 years. Matthias is a frequent speaker at industry related events. Matthias' academic background is RF&Wireless technologies... Read More →

Liam Crosbie

R&D Manager, Dantec Dynamics

Liam Crosbie works as the Research, Development & Product Manager for the Solids Division at Dantec Dynamics in Ulm, Germany. He has over 15 years worth of professional work experience in the materials testing industry, focusing on the application, product & streategic development... Read More →

Chris Nicholson

Product Manager, Comet X-ray

Originally from Scotland, Chris Nicholson completed his PhD in 2018 at the Max Planck Institute in Berlin focusing on laser-induced phase transitions at metal-semiconductor interfaces. Following postdoctoral research he transitioned to industry as an application scientist for electron... Read More →

Tuesday October 27, 2026 3:30pm - 5:00pm CDT
INS

Conference Session, INS Track

8:30am CDT

10:30am CDT

1:30pm CDT

3:30pm CDT

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