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INS4: Eat Your Vegetables, Part II: Test Methods You Need to Know
Tuesday October 27, 2026 3:30pm - 5:00pm CDT
INS
Session Chair:
Session Co-Chair:

3:30pm-4:00pm
FCT for RF/High Speed Applications with Test Probes. Strategies, Pitfalls and How to Avoid Those
Presenter: Matthias Zapatka, Ingun USA

4:00pm-4:30pm
A Three-Camera based Digital Image Correlation System for Warpage Measurement and CTE Distribution Analysis
Presenters: Liam Crosbie, Dantec Dynamics
Co-Author: LiKang Luan, Dantec Dynamics

4:30pm-5:00pm
Need for speed: Boosting X-Ray Inspection Speed in Advanced Electronics
Presenter: Chris Nicholson, Ph.D., Comet X-Ray
Co-Author: Anthony Williams, Comet X-Ray
Speakers
avatar for Matthias Zapatka

Matthias Zapatka

Senior FAE, INGUN USA, Inc.
Matthias is the co-founder and Sr. FAE at INGUN USA, Inc. the North American subsidiary of the INGUN group. He has been in the PCBA test industry for over 18 years. Matthias is a frequent speaker at industry related events. Matthias' academic background is RF&Wireless technologies... Read More →
avatar for Liam Crosbie

Liam Crosbie

R&D Manager, Dantec Dynamics
Liam Crosbie works as the Research, Development & Product Manager for the Solids Division at Dantec Dynamics in Ulm, Germany. He has over 15 years worth of professional work experience in the materials testing industry, focusing on the application, product & streategic development... Read More →
avatar for Chris Nicholson

Chris Nicholson

Product Manager, Comet X-ray
Originally from Scotland, Chris Nicholson completed his PhD in 2018 at the Max Planck Institute in Berlin focusing on laser-induced phase transitions at metal-semiconductor interfaces. Following postdoctoral research he transitioned to industry as an application scientist for electron... Read More →
Tuesday October 27, 2026 3:30pm - 5:00pm CDT
INS
  Conference Session, INS Track

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